X-ray metrology for high-value manufacturing sectors using micro-CT systems.

  • Wood, C. (Organiser)
  • Tristan Lowe (Organiser)

    Activity: Participating in or organising an event types › Participation in workshop, seminar, course

    Description of Activity

    Organiser of the 'X-ray metrology for high-value manufacturing sectors using micro-CT systems.' course.
    PeriodFeb 2024 → Mar 2024
    Event typeCourse
    Degree of RecognitionNational