X-ray metrology for high-value manufacturing sectors using micro-CT systems.

  • Wood, C. (Organiser)
  • Tristan Lowe (Organiser)

Activity: Participating in or organising an event types › Participation in workshop, seminar, course

Description of Activity

Organiser of the 'X-ray metrology for high-value manufacturing sectors using micro-CT systems.' course.
PeriodFeb 2024 → Mar 2024
Event typeCourse
Degree of RecognitionNational