Project Details
Description
A collaborative research network for those using correlative workflows for characterising a range of materials and processes across numerous scientific disciplines.
Layperson's description
Correlative microscopy combines the strengths of different characterisation techniques to provide more information than a single technique alone.
This includes X-ray, electron, atomic force, and optical microscopy, but also spectroscopy (e.g. Raman and fluorescence), diffraction techniques (e.g. XRD), and incorporates both the software and hardware used during the correlative workflow process.
This includes X-ray, electron, atomic force, and optical microscopy, but also spectroscopy (e.g. Raman and fluorescence), diffraction techniques (e.g. XRD), and incorporates both the software and hardware used during the correlative workflow process.
Key findings
A unique interdisciplinary collaboration bringing together different experimental techniques, with members working together on joint publications and proposals, and providing education and outreach opportunities.
Acronym | CoMic |
---|---|
Status | Active |
Effective start/end date | 1/12/20 → … |
Links | https://twitter.com/uop_comic?lang=en |
Keywords
- Correlative microscopy
- Imaging
- Spectroscopy
- Diffraction
- Software
- Hardware
- X-ray microscopy
- Electron microscopy
- Atomic force microscopy
- Optical microscopy
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.
Equipment
-
Atomic Force Microscopy (AFM) NanoScope 4 MultiMode
James Smith (Manager)
Facility/equipment: Equipment
-
-