Adhesion force mapping of polymer surfaces: factors influencing force of adhesion

Nanoindentation measurements form the basis of an atomic force microscopy (AFM) technique that may be employed for the purpose of elucidating the surface heterogeneity of polymeric materials. If the cantilever is stiffer than the substrate, measurement of the extent of cantilever deflection, as the tip is pressed into the sample, probes quantitatively the compliance of the surface as a function of applied load. As with force-of-adhesion measurements, the quantification of indentation measurements may be impeded by the complexity of the tip-sample interactions, especially if a nonelastic surface is probed.