AFM in surface finishing. Part I. An introduction

James Smith, S. Breakspear, S. Campbell

Research output: Contribution to journalArticlepeer-review


It has been 21 years since the invention of the first scanning probe microscope (SPM), the scanning tunnelling microscope (STM), by Gerd Binnig and Heinrich Rohrer. (1) There has been a huge proliferation in the developments and applications of probe microscopy since the design of this first microscope. This paper considers the use of SPM in surface finishing. It provides a brief introduction to atomic force microscopy (AFM), how it compares with electron microscopy and includes some typical examples of applications (2).
Original languageEnglish
Pages (from-to)B26-B29
JournalTransactions of the Institute of Metal Finishing
Issue number2
Publication statusPublished - 2003


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