AFM in surface finishing. Part I. An introduction

James Smith; S. Breakspear; S. Campbell

AFM in surface finishing. Part I. An introduction

James Smith, S. Breakspear, S. Campbell

Institute of Life Sciences and Healthcare

Research output: Contribution to journal › Article › peer-review

Abstract

It has been 21 years since the invention of the first scanning probe microscope (SPM), the scanning tunnelling microscope (STM), by Gerd Binnig and Heinrich Rohrer. (1) There has been a huge proliferation in the developments and applications of probe microscopy since the design of this first microscope. This paper considers the use of SPM in surface finishing. It provides a brief introduction to atomic force microscopy (AFM), how it compares with electron microscopy and includes some typical examples of applications (2).

Original language	English
Pages (from-to)	B26-B29
Journal	Transactions of the Institute of Metal Finishing
Volume	81
Issue number	2
Publication status	Published - 2003

Cite this

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AFM in surface finishing. Part I. An introduction

Abstract

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