AFM in surface finishing: Part II. Surface roughness

James Smith, S. Breakspear, S. Campbell

Research output: Contribution to journalArticlepeer-review


Atomic force microscopy (AFM) is able to provide surface roughness information on a sub-micrometer scale that is not possible using traditional profilometry methods, such as Taly-Surf. These techniques, however, remain useful for characterizing very rough surfaces, although they have now been largely replaced with laser profilometry and interferometry methods. AFM provides a simple, rapid and accurate method for measuring surface roughness of materials where the corrugations are smooth enough to permit stable imaging with the flexible cantilever assembly.

Original languageEnglish
Pages (from-to)B55-B58
JournalTransactions of the Institute of Metal Finishing
Issue number3
Publication statusPublished - May 2003


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