AFM in Surface Finishing: Part III - Lateral force microscopy and friction measurements

James R. Smith*, Steven Breakspear, Sheelagh A. Campbell

*Corresponding author for this work

Research output: Contribution to specialist publicationArticle

Abstract

The use of atomic force microscopy (AFM) in surface finishing is discussed. The application of lateral force microscopy (LFM) as a method for obtaining frictional and tribological data is also presented. The AFM techniques monitors the lateral twisting of the cantilever as it is rastered over the surface. LFM is an AFM technique used for examining the nano-scale friction characteristics.

Original languageEnglish
Pages45-49
Number of pages5
Volume27
No.9
Specialist publicationFinishing
Publication statusPublished - 1 Sep 2003

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