The use of atomic force microscopy (AFM) in surface finishing is discussed. The application of lateral force microscopy (LFM) as a method for obtaining frictional and tribological data is also presented. The AFM techniques monitors the lateral twisting of the cantilever as it is rastered over the surface. LFM is an AFM technique used for examining the nano-scale friction characteristics.
|Number of pages||5|
|Publication status||Published - 1 Sept 2003|