AFM in Surface Finishing: Part III - Lateral force microscopy and friction measurements

James R. Smith; Steven Breakspear; Sheelagh A. Campbell

AFM in Surface Finishing: Part III - Lateral force microscopy and friction measurements

James R. Smith^*, Steven Breakspear, Sheelagh A. Campbell

^*Corresponding author for this work

Research output: Contribution to specialist publication › Article

Abstract

The use of atomic force microscopy (AFM) in surface finishing is discussed. The application of lateral force microscopy (LFM) as a method for obtaining frictional and tribological data is also presented. The AFM techniques monitors the lateral twisting of the cantilever as it is rastered over the surface. LFM is an AFM technique used for examining the nano-scale friction characteristics.

Original language	English
Pages	45-49
Number of pages	5
Volume	27
No.	9
Specialist publication	Finishing
Publication status	Published - 1 Sept 2003

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title = "AFM in Surface Finishing: Part III - Lateral force microscopy and friction measurements",

abstract = "The use of atomic force microscopy (AFM) in surface finishing is discussed. The application of lateral force microscopy (LFM) as a method for obtaining frictional and tribological data is also presented. The AFM techniques monitors the lateral twisting of the cantilever as it is rastered over the surface. LFM is an AFM technique used for examining the nano-scale friction characteristics.",

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AB - The use of atomic force microscopy (AFM) in surface finishing is discussed. The application of lateral force microscopy (LFM) as a method for obtaining frictional and tribological data is also presented. The AFM techniques monitors the lateral twisting of the cantilever as it is rastered over the surface. LFM is an AFM technique used for examining the nano-scale friction characteristics.

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JO - Finishing

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AFM in Surface Finishing: Part III - Lateral force microscopy and friction measurements

Abstract

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