AFM in surface finishing: Part IV. Force-distance curves

J. R. Smith; S. Breakspear; R. J. R. Fletcher; S. A. Campbell

doi:10.1179/002029605X38979

AFM in surface finishing: Part IV. Force-distance curves

J. R. Smith^*, S. Breakspear, R. J. R. Fletcher, S. A. Campbell

^*Corresponding author for this work

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Abstract

The use of atomic surface microscope (AFM) to probe surfaces to obtain local physical information by the acquisition of force-distance curves was discussed. It was found that as the AFM tip approaches the surface of interest, the force-distance trace was usually flat (gradient = 0). It was also found that at any point on the loading curve the applied load can be reduced by pulling the probe away from the surface. The results show that AFM is a high resolution imaging tool that can be used to obtain information about surface finishing.

Original language	English
Pages (from-to)	63-67
Number of pages	5
Journal	Transactions of the Institute of Metal Finishing
Volume	83
Issue number	2
DOIs	https://doi.org/10.1179/002029605X38979
Publication status	Published - 1 Mar 2005

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abstract = "The use of atomic surface microscope (AFM) to probe surfaces to obtain local physical information by the acquisition of force-distance curves was discussed. It was found that as the AFM tip approaches the surface of interest, the force-distance trace was usually flat (gradient = 0). It was also found that at any point on the loading curve the applied load can be reduced by pulling the probe away from the surface. The results show that AFM is a high resolution imaging tool that can be used to obtain information about surface finishing.",

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AB - The use of atomic surface microscope (AFM) to probe surfaces to obtain local physical information by the acquisition of force-distance curves was discussed. It was found that as the AFM tip approaches the surface of interest, the force-distance trace was usually flat (gradient = 0). It was also found that at any point on the loading curve the applied load can be reduced by pulling the probe away from the surface. The results show that AFM is a high resolution imaging tool that can be used to obtain information about surface finishing.

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AFM in surface finishing: Part IV. Force-distance curves

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