AFM in surface finishing: Part IV. Force-distance curves

J. R. Smith*, S. Breakspear, R. J. R. Fletcher, S. A. Campbell

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


The use of atomic surface microscope (AFM) to probe surfaces to obtain local physical information by the acquisition of force-distance curves was discussed. It was found that as the AFM tip approaches the surface of interest, the force-distance trace was usually flat (gradient = 0). It was also found that at any point on the loading curve the applied load can be reduced by pulling the probe away from the surface. The results show that AFM is a high resolution imaging tool that can be used to obtain information about surface finishing.

Original languageEnglish
Pages (from-to)63-67
Number of pages5
JournalTransactions of the Institute of Metal Finishing
Issue number2
Publication statusPublished - 1 Mar 2005


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