Combined nanoindentation and adhesion force mapping using the Atomic Force Microscope: investigations of a filled polysiloxane coating

P. Eaton, F. Estarlich, R. Ewen, Tom Nevell, James Smith, John Tsibouklis

Research output: Contribution to journalArticlepeer-review

Abstract

Using atomic force microscopy, adhesion force and indentation mapping have been combined with measurements of topography in mapping the hardness variations on the surface of a CaCO3-filled silicone coating material. The topographic image revealed a smooth surface with protruding features, matching the size of filler particles (1-3 ím). Mapped indentation and adhesion force measurements showed that these features were associated with increased surface hardness and, also, a suppressed ability to develop adhesive interactions with the probing material (silicon nitride). Furthermore, the indentation images revealed that a boundary region of increased softness surrounded each protruding particle.
Original languageEnglish
Pages (from-to)10011-10015
Number of pages5
JournalLangmuir
Volume18
Issue number25
DOIs
Publication statusPublished - 2002

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