TY - GEN
T1 - Development of a new machine learning-based informatics system for product health monitoring
AU - Papananias, Moschos
AU - Obajemu, Olusayo
AU - McLeay, Thomas E.
AU - Mahfouf, Mahdi
AU - Kadirkamanathan, Visakan
N1 - Funding Information:
The authors gratefully acknowledge funding for this research from the UK Engineering and Physical Sciences Research Council (EPSRC) under Grant Reference: EP/P006930/1.
Publisher Copyright:
© 2020 The Authors.
PY - 2020/9/22
Y1 - 2020/9/22
N2 - Manufacturing informatics aims to optimize productivity by extracting information from numerous data sources and making decisions based on that information about the process and the parts being produced. Manufacturing processes usually include a series of costly operations such as heat treatment, machining, and inspection to produce high-quality parts. However, performing costly operations when the product conformance to specifications cannot be achievable is not desirable. This paper develops a new machine learning-based informatics system capable of predicting the end product quality so that non-value-adding operations such as inspection can be minimized and the process can be stopped before completion when the part being manufactured fails to meet the design specifications.
AB - Manufacturing informatics aims to optimize productivity by extracting information from numerous data sources and making decisions based on that information about the process and the parts being produced. Manufacturing processes usually include a series of costly operations such as heat treatment, machining, and inspection to produce high-quality parts. However, performing costly operations when the product conformance to specifications cannot be achievable is not desirable. This paper develops a new machine learning-based informatics system capable of predicting the end product quality so that non-value-adding operations such as inspection can be minimized and the process can be stopped before completion when the part being manufactured fails to meet the design specifications.
KW - artificial neural networks
KW - manufacturing informatics
KW - multiple linear regression
KW - multistage manufacturing process
KW - principal componet analysis
KW - UKRI
KW - EPSRC
KW - EP/P006930/1
UR - http://www.scopus.com/inward/record.url?scp=85092434311&partnerID=8YFLogxK
UR - https://eprints.whiterose.ac.uk/166464/
U2 - 10.1016/j.procir.2020.03.075
DO - 10.1016/j.procir.2020.03.075
M3 - Conference contribution
AN - SCOPUS:85092434311
T3 - Procedia CIRP
SP - 473
EP - 478
BT - Proceedings of the 53rd CIRP Conference on Manufacturing Systems
PB - Elsevier
T2 - 53rd CIRP Conference on Manufacturing Systems
Y2 - 1 July 2020 through 3 July 2020
ER -