Development of a new machine learning-based informatics system for product health monitoring

Moschos Papananias*, Olusayo Obajemu, Thomas E. McLeay, Mahdi Mahfouf, Visakan Kadirkamanathan

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    Abstract

    Manufacturing informatics aims to optimize productivity by extracting information from numerous data sources and making decisions based on that information about the process and the parts being produced. Manufacturing processes usually include a series of costly operations such as heat treatment, machining, and inspection to produce high-quality parts. However, performing costly operations when the product conformance to specifications cannot be achievable is not desirable. This paper develops a new machine learning-based informatics system capable of predicting the end product quality so that non-value-adding operations such as inspection can be minimized and the process can be stopped before completion when the part being manufactured fails to meet the design specifications.

    Original languageEnglish
    Title of host publicationProceedings of the 53rd CIRP Conference on Manufacturing Systems
    PublisherElsevier
    Pages473-478
    Number of pages6
    DOIs
    Publication statusPublished - 22 Sept 2020
    Event53rd CIRP Conference on Manufacturing Systems - Chicago, United States
    Duration: 1 Jul 20203 Jul 2020

    Publication series

    NameProcedia CIRP
    PublisherElsevier
    Volume93
    ISSN (Print)2212-8271

    Conference

    Conference53rd CIRP Conference on Manufacturing Systems
    Abbreviated titleCMS 2020
    Country/TerritoryUnited States
    CityChicago
    Period1/07/203/07/20

    Keywords

    • artificial neural networks
    • manufacturing informatics
    • multiple linear regression
    • multistage manufacturing process
    • principal componet analysis
    • UKRI
    • EPSRC
    • EP/P006930/1

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