Fullerene van der waals Oligomers as electron traps

Tatyana E. Shubina; Dmitry I. Sharapa; Christina Schubert; Dirk Zahn; Marcus Halik; Paul A. Keller; Stephen G. Pyne; Sreenu Jennepalli; Dirk M. Guldi; Tim Clark

doi:10.1021/ja505949m

Fullerene van der waals Oligomers as electron traps

Tatyana E. Shubina, Dmitry I. Sharapa, Christina Schubert, Dirk Zahn, Marcus Halik, Paul A. Keller, Stephen G. Pyne, Sreenu Jennepalli, Dirk M. Guldi, Tim Clark

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Abstract

Density functional theory calculations indicate that van der Waals fullerene dimers and larger oligomers can form interstitial electron traps in which the electrons are even more strongly bound than in isolated fullerene radical anions. The fullerenes behave like “super atoms”, and the interstitial electron traps represent one-electron intermolecular σ-bonds. Spectroelectrochemical measurements on a bis-fullerene-substituted peptide provide experimental support. The proposed deep electron traps are relevant for all organic electronics applications in which non-covalently linked fullerenes in van der Waals contact with one another serve as n-type semiconductors.

Original language	English
Pages (from-to)	10890–10893
Journal	Journal of the American Chemical Society
Volume	136
Issue number	31
Early online date	22 Jul 2014
DOIs	https://doi.org/10.1021/ja505949m
Publication status	Published - 2014

Keywords

fullerenes
molecular electronics

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This document is the Accepted Manuscript version of a Published Work that appeared in final form in [JournalTitle], copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see http://pubs.acs.org/doi/abs/10.1021/ja505949m
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@article{dac8cf10299a443db1fd7fe4dcc4c72f,

title = "Fullerene van der waals Oligomers as electron traps",

abstract = "Density functional theory calculations indicate that van der Waals fullerene dimers and larger oligomers can form interstitial electron traps in which the electrons are even more strongly bound than in isolated fullerene radical anions. The fullerenes behave like “super atoms”, and the interstitial electron traps represent one-electron intermolecular σ-bonds. Spectroelectrochemical measurements on a bis-fullerene-substituted peptide provide experimental support. The proposed deep electron traps are relevant for all organic electronics applications in which non-covalently linked fullerenes in van der Waals contact with one another serve as n-type semiconductors.",

keywords = "fullerenes, molecular electronics",

author = "Shubina, {Tatyana E.} and Sharapa, {Dmitry I.} and Christina Schubert and Dirk Zahn and Marcus Halik and Keller, {Paul A.} and Pyne, {Stephen G.} and Sreenu Jennepalli and Guldi, {Dirk M.} and Tim Clark",

note = "This document is the Accepted Manuscript version of a Published Work that appeared in final form in Journal of the American Chemical Society, copyright {\textcopyright} American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [insert ACS Articles on Request author-directed link to Published Work, see http://pubs.acs.org/page/policy/articlesonrequest/index.html].",

year = "2014",

doi = "10.1021/ja505949m",

language = "English",

volume = "136",

pages = "10890–10893",

journal = "Journal of the American Chemical Society",

issn = "0002-7863",

publisher = "American Chemical Society",

number = "31",

}

TY - JOUR

T1 - Fullerene van der waals Oligomers as electron traps

AU - Shubina, Tatyana E.

AU - Sharapa, Dmitry I.

AU - Schubert, Christina

AU - Zahn, Dirk

AU - Halik, Marcus

AU - Keller, Paul A.

AU - Pyne, Stephen G.

AU - Jennepalli, Sreenu

AU - Guldi, Dirk M.

AU - Clark, Tim

N1 - This document is the Accepted Manuscript version of a Published Work that appeared in final form in Journal of the American Chemical Society, copyright © American Chemical Society after peer review and technical editing by the publisher. To access the final edited and published work see [insert ACS Articles on Request author-directed link to Published Work, see http://pubs.acs.org/page/policy/articlesonrequest/index.html].

PY - 2014

Y1 - 2014

N2 - Density functional theory calculations indicate that van der Waals fullerene dimers and larger oligomers can form interstitial electron traps in which the electrons are even more strongly bound than in isolated fullerene radical anions. The fullerenes behave like “super atoms”, and the interstitial electron traps represent one-electron intermolecular σ-bonds. Spectroelectrochemical measurements on a bis-fullerene-substituted peptide provide experimental support. The proposed deep electron traps are relevant for all organic electronics applications in which non-covalently linked fullerenes in van der Waals contact with one another serve as n-type semiconductors.

AB - Density functional theory calculations indicate that van der Waals fullerene dimers and larger oligomers can form interstitial electron traps in which the electrons are even more strongly bound than in isolated fullerene radical anions. The fullerenes behave like “super atoms”, and the interstitial electron traps represent one-electron intermolecular σ-bonds. Spectroelectrochemical measurements on a bis-fullerene-substituted peptide provide experimental support. The proposed deep electron traps are relevant for all organic electronics applications in which non-covalently linked fullerenes in van der Waals contact with one another serve as n-type semiconductors.

KW - fullerenes

KW - molecular electronics

U2 - 10.1021/ja505949m

DO - 10.1021/ja505949m

M3 - Article

SN - 0002-7863

VL - 136

SP - 10890

EP - 10893

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

IS - 31

ER -

Fullerene van der waals Oligomers as electron traps

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