Full‐field characterization of a fatigue crack: crack closure revisited

Jie Tong, S. Alshammrei, T. Wigger, Colin Lupton, J. R. Yates

    Research output: Contribution to journalArticlepeer-review

    362 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'Full‐field characterization of a fatigue crack: crack closure revisited'. Together they form a unique fingerprint.

    Engineering

    INIS

    Material Science