TY - JOUR
T1 - High frequency magnetization dynamics metrology using a pulsed field inductive microwave magnetometer
AU - Vopson, Melvin
AU - Lees, K.
AU - Hall, M.
AU - Cain, M. G.
AU - Stewart, M.
AU - Tran, Y.
N1 - This is an author-created, un-copyedited version of an article published in [insert name of journal]. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at 10.1088/0957-0233/25/1/015601."
PY - 2014/1
Y1 - 2014/1
N2 - We report the development of a pulsed inductive microwave magnetometer for measurements of ultra-fast magnetization dynamics of soft magnetic thin films. This paper details the instrument construction and the measurement procedure. We show experimentally that our instrument detects nanosecond and sub-nanosecond magnetization precession/relaxation processes, in real time, without the need for data averaging, interpolation or any other post-measurement data processing. This enhanced detection resolution has been achieved by careful design and optimization of the coplanar waveguide, which will be described in detail in this paper. Moreover, we show that, unlike other similar instruments, our apparatus is significantly simplified, reducing the cost as well as the measurement procedure.
AB - We report the development of a pulsed inductive microwave magnetometer for measurements of ultra-fast magnetization dynamics of soft magnetic thin films. This paper details the instrument construction and the measurement procedure. We show experimentally that our instrument detects nanosecond and sub-nanosecond magnetization precession/relaxation processes, in real time, without the need for data averaging, interpolation or any other post-measurement data processing. This enhanced detection resolution has been achieved by careful design and optimization of the coplanar waveguide, which will be described in detail in this paper. Moreover, we show that, unlike other similar instruments, our apparatus is significantly simplified, reducing the cost as well as the measurement procedure.
KW - ultra-fast magnetization reversal
KW - nano-thin films
KW - pico-second magnetometry
KW - nano-second magnetic relaxation phenomena
KW - instrument design
UR - http://iopscience.iop.org/0957-0233/25/1/015601
U2 - 10.1088/0957-0233/25/1/015601
DO - 10.1088/0957-0233/25/1/015601
M3 - Article
SN - 0957-0233
VL - 25
SP - 015601
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 1
M1 - 015601
ER -