We report the development of a pulsed inductive microwave magnetometer for measurements of ultra-fast magnetization dynamics of soft magnetic thin films. This paper details the instrument construction and the measurement procedure. We show experimentally that our instrument detects nanosecond and sub-nanosecond magnetization precession/relaxation processes, in real time, without the need for data averaging, interpolation or any other post-measurement data processing. This enhanced detection resolution has been achieved by careful design and optimization of the coplanar waveguide, which will be described in detail in this paper. Moreover, we show that, unlike other similar instruments, our apparatus is significantly simplified, reducing the cost as well as the measurement procedure.
- ultra-fast magnetization reversal
- nano-thin films
- pico-second magnetometry
- nano-second magnetic relaxation phenomena
- instrument design