High frequency magnetization dynamics metrology using a pulsed field inductive microwave magnetometer

Melvin Vopson, K. Lees, M. Hall, M. G. Cain, M. Stewart, Y. Tran

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    Abstract

    We report the development of a pulsed inductive microwave magnetometer for measurements of ultra-fast magnetization dynamics of soft magnetic thin films. This paper details the instrument construction and the measurement procedure. We show experimentally that our instrument detects nanosecond and sub-nanosecond magnetization precession/relaxation processes, in real time, without the need for data averaging, interpolation or any other post-measurement data processing. This enhanced detection resolution has been achieved by careful design and optimization of the coplanar waveguide, which will be described in detail in this paper. Moreover, we show that, unlike other similar instruments, our apparatus is significantly simplified, reducing the cost as well as the measurement procedure.
    Original languageEnglish
    Article number015601
    Pages (from-to)015601
    JournalMeasurement Science and Technology
    Volume25
    Issue number1
    Early online date26 Nov 2013
    DOIs
    Publication statusPublished - Jan 2014

    Keywords

    • ultra-fast magnetization reversal
    • nano-thin films
    • pico-second magnetometry
    • nano-second magnetic relaxation phenomena
    • instrument design

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