TY - JOUR
T1 - Infrared metrology for spintronic materials and devices
AU - Vopson, Melvin
AU - Stanton, T.
AU - Thomas, O.
AU - Cain, M.
AU - Thompson, S.
PY - 2009
Y1 - 2009
N2 - Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.
AB - Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.
U2 - 10.1088/0957-0233/20/4/045109
DO - 10.1088/0957-0233/20/4/045109
M3 - Article
SN - 0957-0233
VL - 20
SP - 045109
JO - Measurement Science and Technology
JF - Measurement Science and Technology
IS - 4
ER -