Infrared metrology for spintronic materials and devices

Melvin Vopson, T. Stanton, O. Thomas, M. Cain, S. Thompson

    Research output: Contribution to journalArticlepeer-review


    Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.
    Original languageEnglish
    Pages (from-to)045109
    Number of pages1
    JournalMeasurement Science and Technology
    Issue number4
    Publication statusPublished - 2009


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