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Integration of antiferromagnetic Heusler compound Ru2MnGe into spintronic devices

  • Jan Balluff*
  • , Teodor Huminiuc
  • , Markus Meinert
  • , Atsufumi Hirohata
  • , Günter Reiss
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We report on the integration of an antiferromagnetic Heusler compound acting as a pinning layer into magnetic tunneling junctions (MTJs). The antiferromagnet Ru2MnGe is used to pin the magnetization direction of a ferromagnetic Fe layer in MgO based thin film tunneling magnetoresistance stacks. The samples were prepared using magnetron co-sputtering. We investigate the structural properties by X-ray diffraction and reflection, as well as atomic force and high-resolution transmission electron microscopy. We find an excellent crystal growth quality with a low interface roughnesses of 1-3 Å, which is crucial for the preparation of working tunneling barriers. Using Fe as a ferromagnetic electrode material, we prepared magnetic tunneling junctions and measured the magnetoresistance. We find a sizeable maximum magnetoresistance value of 135%, which is comparable to other common Fe based MTJ systems.

    Original languageEnglish
    Article number032406
    JournalApplied Physics Letters
    Volume111
    Issue number3
    DOIs
    Publication statusPublished - 18 Jul 2017

    Keywords

    • cond-mat.mtrl-sci

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