Intelligent risk prediction of storage tank leakage using an Ishikawa Diagram with probability and impact analysis

Favour Chidinma Ikwan, David Sanders, Malik Haddad, Mohamed Hassan Sayed, Peter Osagie Omoarebun, Mohamad Thabet, Giles Tewkesbury, Branislav Vuksanovic

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    Abstract

    Intelligent probability and impact analysis are used with an Ishikawa diagram. Causes of tank leakage events are identified. Causes were ranked and weights assigned to show their relative importance in the diagram. A Risk Score for each category of causes is identified using probability and impact analysis. The application is explored to predict the risk of leakage in a storage tank. That risk can be mixed with real time data to create an intelligent system. Various methods can be used to predict future system states centred upon an analysis of trends within historic or past data. A simple human computer interface is presented to display the results by overlaying ‘Fail’ or ‘Warning’ states on a schematic of a storage tank. Important information can be flagged alongside conditions. As an example, a surface graph, representing the storage tank condition over a ten-week period is displayed. A continuing deterioration in the score connected with “lack of operating procedures” is presented.
    Original languageEnglish
    Title of host publicationIntelligent Systems and Applications
    Subtitle of host publicationProceedings of the 2020 Intelligent Systems Conference (IntelliSys) Volume 3
    EditorsKohei Arai, Supriya Kapoor, Rahul Bhatia
    PublisherSpringer
    Pages604-616
    ISBN (Electronic)978-3-030-55190-2
    ISBN (Print)978-3-030-55189-6
    DOIs
    Publication statusPublished - 25 Aug 2020
    EventIntelligent Systems Conference - London, United Kingdom
    Duration: 3 Sept 20204 Sept 2020

    Publication series

    NameAdvances in Intelligent Systems and Computing
    PublisherSpringer
    Volume1252
    ISSN (Print)2194-5357
    ISSN (Electronic)2194-5365

    Conference

    ConferenceIntelligent Systems Conference
    Abbreviated titleIntelliSys 2020
    Country/TerritoryUnited Kingdom
    CityLondon
    Period3/09/204/09/20

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