TY - JOUR
T1 - Modelling the magnetorefractive effect in giant magnetoresistive granular and layered materials
AU - Mennicke, R.
AU - Bozec, D.
AU - Kravets, V.
AU - Vopson, Melvin
AU - Matthew, J.
AU - Thompson, S.
PY - 2006/8
Y1 - 2006/8
N2 - The Zhang–Levy–Granovskii (Z–L–G) model of the magnetorefractive effect (MRE) in granular films and the Jacquet–Valet (J–V) model, originally developed for magnetic multilayers, are compared and their common origin demonstrated. Simulations in an extended Hagen–Rubens (H–R) model give new insight into the variation with wavelength of the MRE, and the relative dependence of giant magnetoresistance (GMR) and the MRE to material and experimental parameters such as bulk and interface scattering parameters, mean free paths, grain diameter, polarisation and reflection geometry is explored. The sensitivity of the size, wavelength dependence and the position of the depth of the minimum in the MRE spectra to the different parameters is verified. We establish powerful new equations to correlate the MRE and GMR, and we analyse their validity for a variety of film parameters. This suggests a new approach to the use of the MRE in sensing GMR in the films.
AB - The Zhang–Levy–Granovskii (Z–L–G) model of the magnetorefractive effect (MRE) in granular films and the Jacquet–Valet (J–V) model, originally developed for magnetic multilayers, are compared and their common origin demonstrated. Simulations in an extended Hagen–Rubens (H–R) model give new insight into the variation with wavelength of the MRE, and the relative dependence of giant magnetoresistance (GMR) and the MRE to material and experimental parameters such as bulk and interface scattering parameters, mean free paths, grain diameter, polarisation and reflection geometry is explored. The sensitivity of the size, wavelength dependence and the position of the depth of the minimum in the MRE spectra to the different parameters is verified. We establish powerful new equations to correlate the MRE and GMR, and we analyse their validity for a variety of film parameters. This suggests a new approach to the use of the MRE in sensing GMR in the films.
U2 - 10.1016/j.jmmm.2005.10.233
DO - 10.1016/j.jmmm.2005.10.233
M3 - Article
SN - 0304-8853
VL - 303
SP - 92
EP - 110
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
IS - 1
ER -