Time and thermal dependent effects are critical for the operation of non-volatile memories based on ferroelectrics. In this paper we assume a domain nucleation process of the polarization reversal and we discuss the polarization dynamics in the framework of a non-equilibrium statistical approach. This approach yields analytical expressions, which can be used to explain a wide range of time and thermal dependent effects in ferroelectrics. Experimental P-E loops data obtained for soft ferroelectrics at various temperatures are well predicted by the theory.
|Title of host publication||2010 IEEE International Symposium on the Applications of Ferroelectrics (ISAF)|
|Place of Publication||Piscataway|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Publication status||Published - 2010|