Quantum metrology with entangled coherent states

Jaewoo Joo; William J. Munro; Timothy P. Spiller

doi:10.1103/PhysRevLett.107.083601

Quantum metrology with entangled coherent states

Jaewoo Joo^*, William J. Munro, Timothy P. Spiller

^*Corresponding author for this work

School of Mathematics & Physics

Research output: Contribution to journal › Article › peer-review

85 Downloads (Pure)

Abstract

We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, "bat," and "optimal" states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.

Original language	English
Article number	083601
Journal	Physical Review Letters
Volume	107
Issue number	8
Early online date	16 Aug 2011
DOIs	https://doi.org/10.1103/PhysRevLett.107.083601
Publication status	Published - 19 Aug 2011

Access to Document

10.1103/PhysRevLett.107.083601

PhysRevLett.107.083601
Jaewoo Joo, William J. Munro, and Timothy P. Spiller, 'Quantum Metrology with Entangled Coherent States.' Phys. Rev. Lett. 107, 083601. DOI:https://doi.org/10.1103/PhysRevLett.107.083601. © 2011 American Physical Society. All rights reserved.
Final published version, 266 KB

Cite this

@article{7c12f826a50447ee9636617c92e7a8d1,

title = "Quantum metrology with entangled coherent states",

abstract = "We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, {"}bat,{"} and {"}optimal{"} states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.",

author = "Jaewoo Joo and Munro, {William J.} and Spiller, {Timothy P.}",

year = "2011",

month = aug,

day = "19",

doi = "10.1103/PhysRevLett.107.083601",

language = "English",

volume = "107",

journal = "Physical Review Letters",

issn = "0031-9007",

publisher = "American Physical Society",

number = "8",

}

TY - JOUR

T1 - Quantum metrology with entangled coherent states

AU - Joo, Jaewoo

AU - Munro, William J.

AU - Spiller, Timothy P.

PY - 2011/8/19

Y1 - 2011/8/19

N2 - We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, "bat," and "optimal" states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.

AB - We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, "bat," and "optimal" states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.

UR - http://www.scopus.com/inward/record.url?scp=84860389395&partnerID=8YFLogxK

U2 - 10.1103/PhysRevLett.107.083601

DO - 10.1103/PhysRevLett.107.083601

M3 - Article

AN - SCOPUS:84860389395

SN - 0031-9007

VL - 107

JO - Physical Review Letters

JF - Physical Review Letters

IS - 8

M1 - 083601

ER -

Quantum metrology with entangled coherent states

Abstract

Access to Document

Fingerprint

Cite this