Quantum metrology with entangled coherent states

Jaewoo Joo*, William J. Munro, Timothy P. Spiller

*Corresponding author for this work

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We present an improved phase estimation scheme employing entangled coherent states and demonstrate that these states give the smallest variance in the phase parameter in comparison to NOON, "bat," and "optimal" states under perfect and lossy conditions. As these advantages emerge for very modest particle numbers, the optical version of entangled coherent state metrology is achievable with current technology.

Original languageEnglish
Article number083601
JournalPhysical Review Letters
Issue number8
Early online date16 Aug 2011
Publication statusPublished - 19 Aug 2011


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