TY - GEN
T1 - Research on weak signal detection technique for electromagnetic ultrasonic inspection system
AU - Kang, Lei
AU - Mi, Wujun
AU - Lv, Chao
AU - Wang, Shujuan
PY - 2008/8/1
Y1 - 2008/8/1
N2 - Electromagnetic acoustic transducers (EMATs) are very sensitive to surrounding noise while their transduction efficiency is rather poor. Consequently, ultrasonic signals received by EMATs are often contaminated by strong noise. To extract information of the received signals, a weak signal detection technique based on moving average, cross-correlation and self-correlation methods has been proposed. Crack signals obtained by an electromagnetic ultrasonic inspection system are processed by this cross-and-self-correlation detection technique. Feasibility and efficiency of the proposed technique are verified by experiment results with high reproducibility. By combining cross-correlation and self-correlation detection methods, this technique possesses a much stronger capability of weak signal detection than applying them individually.
AB - Electromagnetic acoustic transducers (EMATs) are very sensitive to surrounding noise while their transduction efficiency is rather poor. Consequently, ultrasonic signals received by EMATs are often contaminated by strong noise. To extract information of the received signals, a weak signal detection technique based on moving average, cross-correlation and self-correlation methods has been proposed. Crack signals obtained by an electromagnetic ultrasonic inspection system are processed by this cross-and-self-correlation detection technique. Feasibility and efficiency of the proposed technique are verified by experiment results with high reproducibility. By combining cross-correlation and self-correlation detection methods, this technique possesses a much stronger capability of weak signal detection than applying them individually.
UR - http://www.scopus.com/inward/record.url?scp=51949102103&partnerID=8YFLogxK
U2 - 10.1109/ICIEA.2008.4582946
DO - 10.1109/ICIEA.2008.4582946
M3 - Conference contribution
AN - SCOPUS:51949102103
SN - 9781424417179
T3 - IEEE ICIEA Proceedings
SP - 2394
EP - 2399
BT - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2008 3rd IEEE Conference on Industrial Electronics and Applications, ICIEA 2008
Y2 - 3 June 2008 through 5 June 2008
ER -