Scanning probe microscopy studies of Ebonex(R) electrodes

James Smith, A. Nahle, F. Walsh

Research output: Contribution to journalArticlepeer-review


The porosity of Ebonex(R) electrodes is known to have a marked affect on their electrochemical properties. Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) have been used to investigate the topography of porous and fully-hardened (nonporous) Ebonex(R) at high resolution. AFM has also been used to study the early stages of copper electrodeposition on porous Ebonex(R) electrodes. Initial copper nucleation and growth were found to occur preferentially at surface pores.
Original languageEnglish
Pages (from-to)815-820
Number of pages6
JournalJournal of Applied Electrochemistry
Issue number7
Publication statusPublished - 1997


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