The use of scanning probe microscopy in surface finishing and engineering

James R. Smith*, Sheelagh A. Campbell, Frank C. Walsh

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Scanning Probe Microscopy (SPM) encompasses a range of probe techniques such as Atomic Force Microscopy (AFM) which have many potential applications in the fields of metal finishing and surface engineering. The power of the technique lies in its ability to image deposition and corrosion processes at extremely high resolution, even down to the atomic scale when required. At the University of Portsmouth, we have used AFM in areas such as the early growth of copper electrodeposits in the presence of organic additives, topographical studies ofzincale immersion layers, electroless nickel coatings and ceramic electrode materials. We have also used the technique for quantitative surface metrication studies and surface roughness characterisation of femoral heads (90%Ti, 6%A1, 4%V) ofhlpprostheses. This paper provides a concise review of these techniques and their application In surface finishing. Future developments of the technique In the areas of metal finishing and corrosion are also considered.

Original languageEnglish
Pages (from-to)B53-B61
Number of pages9
JournalTransactions of the Institute of Metal Finishing
Issue number4
Publication statusPublished - 1 Aug 1998


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