Universal void density profiles from simulation and SDSS

S. Nadathur*, Shaun Hotchkiss, J. M. Diego, I. T. Iliev, S. Gottlöber, W. A. Watson, G. Yepes

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


We discuss the universality and self-similarity of void density profiles, for voids in realistic mock luminous red galaxy (LRG) catalogues from the Jubilee simulation, as well as in void catalogues constructed from the SDSS LRG and Main Galaxy samples. Voids are identified using a modified version of the ZOBOV watershed transform algorithm, with additional selection cuts. We find that voids in simulation are self-similar, meaning that their average rescaled profile does not depend on the void size, or - within the range of the simulated catalogue - on the redshift. Comparison of the profiles obtained from simulated and real voids shows an excellent match. The profiles of real voids also show a universal behaviour over a wide range of galaxy luminosities, number densities and redshifts. This points to a fundamental property of the voids found by the watershed algorithm, which can be exploited in future studies of voids.

Original languageEnglish
Pages (from-to)542-545
Number of pages4
JournalProceedings of the International Astronomical Union
Publication statusPublished - 1 Jun 2014


  • catalogues
  • cosmology: observations
  • large-scale structure of Universe
  • methods: numerical
  • methods: data analysis


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