XPS and TEM Applied to Surfaces and Interfaces Characterization
Activity: Participating in or organising an event types › Participation in workshop, seminar, course
Aleksander Krupski (Organiser), 26 Feb 2015
“Growth morphology of thin films on the metallic and oxide surfaces.”
26 Feb 2015
XPS and TEM Applied to Surfaces and Interfaces Characterization
| Duration | 23 Feb 2015 → 27 Feb 2015 |
|---|---|
| Description | Institute of Physics PAS and University of Warwick Twinning Seminar on XPS and TEM Applied to Surfaces and Interfaces Characterization. |
| Location of event | Polish Academy of Science |
| City | Warsaw |
| Country | Poland |
| Degree of recognition | International event |
Event: Seminar
Related information
Outputs
Growth morphology of thin films on metallic and oxide surfaces
Research output: Contribution to journal › Article › peer-review
ID: 2809318
