Skip to content
Back to outputs

Adhesion force mapping of polymer surfaces: factors influencing force of adhesion

Research output: Contribution to journalArticle

Standard

Adhesion force mapping of polymer surfaces: factors influencing force of adhesion. / Eaton, P.; Smith, James; Graham, P.; Smart, J.; Nevell, Tom; Tsibouklis, John.

In: Langmuir, Vol. 18, No. 8, 2002, p. 3387-3389.

Research output: Contribution to journalArticle

Harvard

APA

Vancouver

Author

Eaton, P. ; Smith, James ; Graham, P. ; Smart, J. ; Nevell, Tom ; Tsibouklis, John. / Adhesion force mapping of polymer surfaces: factors influencing force of adhesion. In: Langmuir. 2002 ; Vol. 18, No. 8. pp. 3387-3389.

Bibtex

@article{ea95b366e6f84add9a373e04d75a3588,
title = "Adhesion force mapping of polymer surfaces: factors influencing force of adhesion",
abstract = "Nanoindentation measurements form the basis of an atomic force microscopy (AFM) technique that may be employed for the purpose of elucidating the surface heterogeneity of polymeric materials. If the cantilever is stiffer than the substrate, measurement of the extent of cantilever deflection, as the tip is pressed into the sample, probes quantitatively the compliance of the surface as a function of applied load. As with force-of-adhesion measurements, the quantification of indentation measurements may be impeded by the complexity of the tip-sample interactions, especially if a nonelastic surface is probed.",
author = "P. Eaton and James Smith and P. Graham and J. Smart and Tom Nevell and John Tsibouklis",
year = "2002",
doi = "10.1021/la015633l",
language = "English",
volume = "18",
pages = "3387--3389",
journal = "Langmuir",
issn = "0743-7463",
publisher = "American Chemical Society",
number = "8",

}

RIS

TY - JOUR

T1 - Adhesion force mapping of polymer surfaces: factors influencing force of adhesion

AU - Eaton, P.

AU - Smith, James

AU - Graham, P.

AU - Smart, J.

AU - Nevell, Tom

AU - Tsibouklis, John

PY - 2002

Y1 - 2002

N2 - Nanoindentation measurements form the basis of an atomic force microscopy (AFM) technique that may be employed for the purpose of elucidating the surface heterogeneity of polymeric materials. If the cantilever is stiffer than the substrate, measurement of the extent of cantilever deflection, as the tip is pressed into the sample, probes quantitatively the compliance of the surface as a function of applied load. As with force-of-adhesion measurements, the quantification of indentation measurements may be impeded by the complexity of the tip-sample interactions, especially if a nonelastic surface is probed.

AB - Nanoindentation measurements form the basis of an atomic force microscopy (AFM) technique that may be employed for the purpose of elucidating the surface heterogeneity of polymeric materials. If the cantilever is stiffer than the substrate, measurement of the extent of cantilever deflection, as the tip is pressed into the sample, probes quantitatively the compliance of the surface as a function of applied load. As with force-of-adhesion measurements, the quantification of indentation measurements may be impeded by the complexity of the tip-sample interactions, especially if a nonelastic surface is probed.

U2 - 10.1021/la015633l

DO - 10.1021/la015633l

M3 - Article

VL - 18

SP - 3387

EP - 3389

JO - Langmuir

JF - Langmuir

SN - 0743-7463

IS - 8

ER -

ID: 75018