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AFM in surface finishing. Part I. An introduction

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It has been 21 years since the invention of the first scanning probe microscope (SPM), the scanning tunnelling microscope (STM), by Gerd Binnig and Heinrich Rohrer. (1) There has been a huge proliferation in the developments and applications of probe microscopy since the design of this first microscope. This paper considers the use of SPM in surface finishing. It provides a brief introduction to atomic force microscopy (AFM), how it compares with electron microscopy and includes some typical examples of applications (2).
Original languageEnglish
Pages (from-to)B26-B29
JournalTransactions of the Institute of Metal Finishing
Volume81
Issue number2
Publication statusPublished - 2003

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