Skip to content

AFM in surface finishing. Part III. Lateral force microscopy and friction measurements

Research output: Contribution to journalArticlepeer-review

This paper is the third in a series of practical topics on the use of atomic force microscopy (AFM) in surface finishing and focuses on lateral force microscopy (LFM) as a method for obtaining frictional, or tribological, data. This AFM technique monitors the lateral twisting of the cantilever as it is rastered over the sample's surface. The resulting image, which can be obtained simultaneously with the topography (height) image, shows contrast between areas with differing frictional properties. LFM has been applied to the study of a wide range of systems, including: single crystals, alkanethiols on golds, silanes on glass, conducting polymers, polyurethanes and biological surfaces.
Original languageEnglish
Pages (from-to)B68-B70
JournalTransactions of the Institute of Metal Finishing
Issue number4
Publication statusPublished - 2003

Related information

Relations Get citation (various referencing formats)

ID: 74896