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High frequency magnetization dynamics metrology using a pulsed field inductive microwave magnetometer

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We report the development of a pulsed inductive microwave magnetometer for measurements of ultra-fast magnetization dynamics of soft magnetic thin films. This paper details the instrument construction and the measurement procedure. We show experimentally that our instrument detects nanosecond and sub-nanosecond magnetization precession/relaxation processes, in real time, without the need for data averaging, interpolation or any other post-measurement data processing. This enhanced detection resolution has been achieved by careful design and optimization of the coplanar waveguide, which will be described in detail in this paper. Moreover, we show that, unlike other similar instruments, our apparatus is significantly simplified, reducing the cost as well as the measurement procedure.
Original languageEnglish
Article number015601
Pages (from-to)015601
JournalMeasurement Science and Technology
Volume25
Issue number1
Early online date26 Nov 2013
DOIs
Publication statusPublished - Jan 2014

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    Rights statement: This is an author-created, un-copyedited version of an article published in [insert name of journal]. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at 10.1088/0957-0233/25/1/015601."

    Accepted author manuscript (Post-print), 698 KB, PDF document

    Licence: CC BY

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