Scanning probe microscopy studies of Ebonex(R) electrodes
Research output: Contribution to journal › Article › peer-review
The porosity of Ebonex(R) electrodes is known to have a marked affect on their electrochemical properties. Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) have been used to investigate the topography of porous and fully-hardened (nonporous) Ebonex(R) at high resolution. AFM has also been used to study the early stages of copper electrodeposition on porous Ebonex(R) electrodes. Initial copper nucleation and growth were found to occur preferentially at surface pores.
|Number of pages||6|
|Journal||Journal of Applied Electrochemistry|
|Publication status||Published - 1997|