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Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach

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Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach. / Lamprou, Dimitris; Smith, James; Nevell, Tom; Barbu, Eugen; Willis, C.; Tsibouklis, John.

In: Journal of Advanced Microscopy Research, Vol. 5, 2010, p. 138-142.

Research output: Contribution to journalArticle

Harvard

Lamprou, D, Smith, J, Nevell, T, Barbu, E, Willis, C & Tsibouklis, J 2010, 'Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach', Journal of Advanced Microscopy Research, vol. 5, pp. 138-142. https://doi.org/10.1166/jamr.2010.1035

APA

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Author

Lamprou, Dimitris ; Smith, James ; Nevell, Tom ; Barbu, Eugen ; Willis, C. ; Tsibouklis, John. / Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach. In: Journal of Advanced Microscopy Research. 2010 ; Vol. 5. pp. 138-142.

Bibtex

@article{962dcdec9aa340aa84fe879016fde33d,
title = "Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach",
abstract = "Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl)triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl)propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.",
author = "Dimitris Lamprou and James Smith and Tom Nevell and Eugen Barbu and C. Willis and John Tsibouklis",
year = "2010",
doi = "10.1166/jamr.2010.1035",
language = "English",
volume = "5",
pages = "138--142",
journal = "Journal of Advanced Microscopy Research",
issn = "2156-7573",
publisher = "American Scientific Publishers",

}

RIS

TY - JOUR

T1 - Towards the determination of surface energy at the nanoscale: a further assessment of the AFM-based approach

AU - Lamprou, Dimitris

AU - Smith, James

AU - Nevell, Tom

AU - Barbu, Eugen

AU - Willis, C.

AU - Tsibouklis, John

PY - 2010

Y1 - 2010

N2 - Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl)triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl)propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.

AB - Towards the validation of the atomic force microscopy-based approach to the determination of surface energy at the nanometer scale, this paper explores the applicability of the technique by comparing atomic force microscopy-derived surface energy values with those from conventional contact angle measurements from a range of self-assembled organosilane structures ((3-aminopropyl)triethoxysilane, (3-glycidoxypropyl)trimethoxysilane, 3-(triethoxysilyl)propylsuccinic anhydride and trimethoxy(propyl)silane) and also from films of an ultra-low-surface-energy polymer, poly(1H,1H,2H,2H-perfluorodecyl methacrylate). The close agreement between the two sets of data indicates the validity of the AFM method, while unique attributes are indicated by the high resolution (ca. 1000 atoms) that is inherent to the approach and by the capability to study materials that are not compatible with the probing liquids used for goniometric determinations.

U2 - 10.1166/jamr.2010.1035

DO - 10.1166/jamr.2010.1035

M3 - Article

VL - 5

SP - 138

EP - 142

JO - Journal of Advanced Microscopy Research

JF - Journal of Advanced Microscopy Research

SN - 2156-7573

ER -

ID: 63153